s 4800i field emission sem Search Results


s 4800 i scanning electron microscope  (Hitachi Ltd)
99
Hitachi Ltd s 4800 i scanning electron microscope
S 4800 I Scanning Electron Microscope, supplied by Hitachi Ltd, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/s+4800i+field+emission+sem/SU8600/10__1016_slash_j__conbuildmat__2026__145596-85-6-11
Average 99 stars, based on 1 article reviews
s 4800 i scanning electron microscope - by Bioz Stars, 2026-09
99/100 stars
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field emission sem  (JEOL)
99
JEOL field emission sem
Figure 1. (a) <t>SEM</t> image of FNGO. <t>(b)</t> <t>TEM</t> and (c) HR-TEM images of FNGO (inset shows the corresponding SAED). (d) Elemental mapping images of C, F, and N components.
Field Emission Sem, supplied by JEOL, used in various techniques. Bioz Stars score: 99/100, based on 1 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
https://www.bioz.com/product/s+4800i+field+emission+sem/JEM-2100F+Transmission+Electron+Microscope/pm34823235-70-15-12
Average 99 stars, based on 1 article reviews
field emission sem - by Bioz Stars, 2026-09
99/100 stars
  Buy from Supplier

Image Search Results


Figure 1. (a) SEM image of FNGO. (b) TEM and (c) HR-TEM images of FNGO (inset shows the corresponding SAED). (d) Elemental mapping images of C, F, and N components.

Journal: Nanotechnology

Article Title: Long-term corrosion protection of styrene acrylic coatings enhanced by fluorine and nitrogen co-doped graphene oxide.

doi: 10.1088/1361-6528/ac3d65

Figure Lengend Snippet: Figure 1. (a) SEM image of FNGO. (b) TEM and (c) HR-TEM images of FNGO (inset shows the corresponding SAED). (d) Elemental mapping images of C, F, and N components.

Article Snippet: The morphology and surface microstructures were investigated by field emission TEM (FE-TEM, JEOL JEM-2100F) and field emission SEM (FE-SEM, S-4800-I, Japan).

Techniques: